2nd Workshop on Characterization and Analysis of Nanomaterials
University of Aveiro, Portugal July 7, 2020

Progress in science depends mainly on the level of experimental technology. Currently, interest in nanomaterials has led to many technological advances and has opened new horizons in understanding nature. Success in these ways possible by the development and standardization of methods for determining the characteristics of nanomaterials: X-ray diffraction, electron microscopy, atomic force microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, modeling of nanostructures, etc. A thorough knowledge of these methods is a necessary basis for work in modern science. The major aim of this workshop is to give a detailed description of principles and current status basic methods for characterization of nanomaterials.

2nd WCANM-2020 Organizing committee

António Manuel de Bastos Pereira (UA, Portugal)
Paula Alexandrina de Aguiar Pereira Marques (UA, Portugal)
Duncan Paul Fagg  (UA, Portugal)
Igor Bdikin (UA, Portugal)
Gonzalo Guillermo Otero Irurueta  (UA, Portugal)
Gil Alberto Batista Gonçalves  (UA, Portugal)

Experimental techniques:

X-ray diffraction
High resolution electron microscopy
Atomic force microscopy
Raman Spectroscopy
X-ray photoelectron spectroscopy
Modeling of nano-structures


2D materials, Graphene
thin films
amorphous solids
single crystals
composite materials
magnetic materials
electric materials


* This year the world is in a very serious situation with the PANDEMIA COVID-19. Many human activities have changed due to this new phenomenon.
Therefore, 2nd Workshop on Characterization and Analysis of Nanomaterials will be in online format.